An Indirect Diagnosis of VTT Power Rail Defect in DDR3 Memory System by Using Intensive Address Switching Test Algorithms

Abstract

In this paper, a DDR3 memory system had been made which has defective VTT power rail. Then, the memory system was tested by using some memory test algorithms. The system failed for the test algorithms that have intensive address switching. The relation between the failures and VTT power rail has been shown. Also, an indirect diagnosis method for the defective VTT power rail had been suggested.