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다중 전원 영역 기반 SoC의 모듈러 스캔 테스트를 위한 IEEE std. 1149.1-2013 기반의 테스트 전원 제어 기술
- Issue Date
- Feb-2017
- Conference Name
- 한국반도체학술대회
- Place
- 대한민국
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Collections - COLLEGE OF COMPUTING > SCHOOL OF COMPUTER SCIENCE > 2. Conference Papers
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