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High-Frequency Characterization of Fine Interconnect Lines
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 어영선 | - |
| dc.date.accessioned | 2025-04-09T01:31:51Z | - |
| dc.date.available | 2025-04-09T01:31:51Z | - |
| dc.date.issued | 2011-02-17 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/124220 | - |
| dc.title | High-Frequency Characterization of Fine Interconnect Lines | - |
| dc.type | Conference | - |
| dc.citation.title | 제18회 한국반도체학술대회 | - |
| dc.citation.startPage | 363 | - |
| dc.citation.endPage | 364 | - |
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- EO, YUNG SEON
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)