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CHARACTERIZING A NEGATIVE BINOMIAL PROCESS FOR A GAMMA DISTRIBUTED FAILURE RATE

Authors
KIM, W. H.AHN, SEON EUNGPARK, C. S.
Issue Date
24-Aug-2006
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/124830
Conference Name
Advanced Reliability Modeling II: Reliability Testing and Improvement
Place
대한민국
Busan, Korea
Conference Date
2006-08-24 ~ 2006-08-26
Conference Name
proceedings of the 2nd Asian International Workshop (AIWARM 2006)
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COLLEGE OF ENGINEERING SCIENCES > DEPARTMENT OF INDUSTRIAL & MANAGEMENT ENGINEERING > 2. Conference Papers

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