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Robust Wafer Defect Pattern Classification and New Defect Pattern Detection in Imbalanced Data Using Few-Shot Learning
- Authors
- 김병훈
- Issue Date
- 20-Oct-2024
- Place
- Seattle Convention Center
- Conference Name
- 2024 INFORMS ANNUAL MEETING
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Related Researcher
- Kim, Byunghoon
- ERICA 공학대학 (DEPARTMENT OF INDUSTRIAL & MANAGEMENT ENGINEERING)