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Local ferroelectric responses of epitaxial PbTiO3 thin films to heated atomic force microscopy
- Authors
- Seo, Jeongdae; Ahn, Yoonho; Kim, Woo Hee; Son, Jong Yeog
- Issue Date
- Apr-2016
- Publisher
- Elsevier BV
- Keywords
- Activation energy; Ferroelectric domain size; Heated AFM
- Citation
- Materials Letters, v.168, pp.134 - 137
- Indexed
- SCIE
SCOPUS
- Journal Title
- Materials Letters
- Volume
- 168
- Start Page
- 134
- End Page
- 137
- ISSN
- 0167-577X
- Abstract
- We report the dependence of ferroelectric domain size of epitaxially grown PbTiO3 (PTO) thin films on Nb-doped SrTiO3 substrate to temperature. PbTiO3 exhibited well-defined ferroelectricity with a high remnant polarization of about 60 μC/cm2. Based on piezoelectric force microscopy (PFM) measurements, we confirmed that the ferroelectric domain size of PbTiO3 thin films depends on electric field and temperature. The minimum ferroelectric domain size could be reduced by the locally heated atomic force microscopy (h-AFM) technique. © 2016 Elsevier B.V. All rights reserved.
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Related Researcher
- Kim, Woo Hee
- ERICA 공학대학 (DEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING)