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Influence of current aging on the characteristics of Near-Ultraviolet LEDs
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Choi, Hyo-Shik | - |
| dc.contributor.author | Shim, Jong-In | - |
| dc.contributor.author | Choi, Won-Jin | - |
| dc.date.accessioned | 2021-06-22T18:21:57Z | - |
| dc.date.available | 2021-06-22T18:21:57Z | - |
| dc.date.issued | 2016-01 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/15980 | - |
| dc.description.abstract | We analyzed the influence of a current aging on 380 nm band near-ultraviolet light-emitting diodes with different current densities. Aging have been carried out on LEDs with current densities of 5, 35 and 50 A/cm2 at room temperature for 1000 h. After stressed, both optical and electrical characteristics of LEDS are getting worse as increasing aging current density. We suggest that the possible degradation mechanism of characteristics is increase of the non-radiative (NR) recombination of LEDs due to generation of NR recombination centers in active regions after a current aging. © 2015 IEEE. | - |
| dc.format.extent | 2 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
| dc.title | Influence of current aging on the characteristics of Near-Ultraviolet LEDs | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1109/CLEOPR.2015.7376077 | - |
| dc.identifier.scopusid | 2-s2.0-84964047428 | - |
| dc.identifier.bibliographicCitation | 2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015, v.2, pp 1 - 2 | - |
| dc.citation.title | 2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015 | - |
| dc.citation.volume | 2 | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 2 | - |
| dc.type.docType | Conference Paper | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.subject.keywordPlus | Current density | - |
| dc.subject.keywordPlus | Degradation | - |
| dc.subject.keywordPlus | Active regions | - |
| dc.subject.keywordPlus | Degradation mechanism | - |
| dc.subject.keywordPlus | Electrical characteristic | - |
| dc.subject.keywordPlus | Near-ultraviolet LED | - |
| dc.subject.keywordPlus | Near-ultraviolet light-emitting diode | - |
| dc.subject.keywordPlus | Non-radiative | - |
| dc.subject.keywordPlus | Recombination centers | - |
| dc.subject.keywordPlus | Light emitting diodes | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/7376077 | - |
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- Shim, Jong In
- ERICA 첨단융합대학 (ERICA 반도체·디스플레이공학전공)