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Carrier overflow in InGaN/GaN light-emitting diodes investigated by temperature-dependent short-circuit current characteristics

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dc.contributor.authorYoun, Dong-Kuk-
dc.contributor.authorLee, Gyeong Won-
dc.contributor.authorShim, Jong In-
dc.contributor.authorShin, Dong Soo-
dc.date.accessioned2021-06-22T18:22:07Z-
dc.date.available2021-06-22T18:22:07Z-
dc.date.created2021-01-22-
dc.date.issued2016-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/15986-
dc.description.abstractThe temperature dependence of the short-circuit current in the InGaN/GaN multiple-quantum-well light-emitting diode is investigated. From the experiments, we demonstrate that the carrier overflow to the p-GaN clad occurs more severely with decreasing temperature, resembling the behavior of the efficiency droop and the open-circuit voltage. © 2015 IEEE.-
dc.language영어-
dc.language.isoen-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleCarrier overflow in InGaN/GaN light-emitting diodes investigated by temperature-dependent short-circuit current characteristics-
dc.typeArticle-
dc.contributor.affiliatedAuthorShim, Jong In-
dc.contributor.affiliatedAuthorShin, Dong Soo-
dc.identifier.doi10.1109/CLEOPR.2015.7376083-
dc.identifier.scopusid2-s2.0-84964018996-
dc.identifier.bibliographicCitation2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015, v.2, pp.1 - 2-
dc.relation.isPartOf2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015-
dc.citation.title2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015-
dc.citation.volume2-
dc.citation.startPage1-
dc.citation.endPage2-
dc.type.rimsART-
dc.type.docTypeConference Paper-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordPlusGallium nitride-
dc.subject.keywordPlusIII-V semiconductors-
dc.subject.keywordPlusLight-
dc.subject.keywordPlusLight emitting diodes-
dc.subject.keywordPlusOpen circuit voltage-
dc.subject.keywordPlusQuantum well lasers-
dc.subject.keywordPlusTemperature distribution-
dc.subject.keywordPlusTiming circuits-
dc.subject.keywordPlusEfficiency droops-
dc.subject.keywordPlusInGaN/GaN-
dc.subject.keywordPlusInGaN/GaN multiple quantum well light emitting diodes-
dc.subject.keywordPlusTemperature dependence-
dc.subject.keywordPlusTemperature dependent-
dc.subject.keywordPlusSemiconductor quantum wells-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/7376083-
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