Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Modelling and evaluation of low voltage DC circuit breaker for the protection of DC microgrid

Full metadata record
DC Field Value Language
dc.contributor.authorPramudya, I.-
dc.contributor.authorKhan, Umer Amir-
dc.contributor.authorSuwarno,-
dc.contributor.authorKoo, J.Y.-
dc.contributor.authorLee, B.W.-
dc.date.accessioned2021-06-22T18:22:50Z-
dc.date.available2021-06-22T18:22:50Z-
dc.date.issued2016-09-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/16019-
dc.description.abstractDC microgrid has become a preferred choice over AC microgrid, due to the growth of critical DC loads and higher efficiency during power distribution. However, the transient behavior of DC microgrid is more severe than AC microgrid, which makes the correct DC Circuit Breaker (DCCB) selection very important. In this research paper, we have proposed an evaluation method to select a commercially available DCCB by using simulation results of the stresses subjected to DCCB in low voltage DC microgrid (LVDCM). A LVDCM having AC utility grid, photovoltaic (PV) and battery-storage was modeled. A DCCB model using Schwarz's Black Box arc model was applied in the LVDCM, and its parameters were determined by using parameter sweep method. Voltage and current stresses subjected to DCCBs were analyzed and compared with DCCB's capability based on its datasheet. An appropriate DCCB was selected by comparing the voltage and current stresses with DCCB's datasheet limit. © 2016 IEEE.-
dc.format.extent4-
dc.language영어-
dc.language.isoENG-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleModelling and evaluation of low voltage DC circuit breaker for the protection of DC microgrid-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1109/CMD.2016.7757819-
dc.identifier.scopusid2-s2.0-85007200880-
dc.identifier.bibliographicCitationCMD 2016 - International Conference on Condition Monitoring and Diagnosis, v.2016, pp 295 - 298-
dc.citation.titleCMD 2016 - International Conference on Condition Monitoring and Diagnosis-
dc.citation.volume2016-
dc.citation.startPage295-
dc.citation.endPage298-
dc.type.docTypeConference Paper-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassother-
dc.subject.keywordPlusElectric circuit breakers-
dc.subject.keywordPlusTiming circuits-
dc.subject.keywordPlusArc modeling-
dc.subject.keywordPlusCurrent stress-
dc.subject.keywordPlusElectrical faults-
dc.subject.keywordPlusLow voltages-
dc.subject.keywordPlusVoltage stress-
dc.subject.keywordPlusCondition monitoring-
dc.subject.keywordAuthorCurrent stress-
dc.subject.keywordAuthorelectrical fault-
dc.subject.keywordAuthorlow voltage DC microgrid-
dc.subject.keywordAuthorlow voltage DCCB-
dc.subject.keywordAuthorSchwarz's black box arc model-
dc.subject.keywordAuthorvoltage stress-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/7757819-
Files in This Item
Go to Link
Appears in
Collections
COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Lee, Bang Wook photo

Lee, Bang Wook
ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)
Read more

Altmetrics

Total Views & Downloads

BROWSE