Direct Evidence of Electronic Interaction at the Atomic-Layer-Deposited MoS2Monolayer/SiO2Interface
DC Field | Value | Language |
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dc.contributor.author | Lee, Minji | - |
dc.contributor.author | Kim, Yejin | - |
dc.contributor.author | Mohamed, Ahmed.Yousef | - |
dc.contributor.author | Lee, Han koo | - |
dc.contributor.author | Ihm, Kyuwook | - |
dc.contributor.author | Kim, Dae hyun | - |
dc.contributor.author | Park, Tae joo | - |
dc.contributor.author | Cho, Deok yong | - |
dc.date.accessioned | 2021-06-22T09:21:53Z | - |
dc.date.available | 2021-06-22T09:21:53Z | - |
dc.date.created | 2021-01-22 | - |
dc.date.issued | 2020-12 | - |
dc.identifier.issn | 1944-8244 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/1800 | - |
dc.description.abstract | The electronic structure of an atomic-layer-deposited MoS2 monolayer on SiO2 was investigated using X-ray absorption spectroscopy (XAS) and synchrotron X-ray photoelectron spectroscopy (XPS). The angle-dependent evolution of the XAS spectra and the photon-energy-dependent evolution of the XPS spectra were analyzed in detail using an ab initio electronic structure simulation. Although similar to the theoretical spectra of an ideal free-standing MoS2 ML, the experimental spectra exhibit features that are distinct from those of an ideal ML, which can be interpreted as a consequence of S-O van der Waals (vdW) interactions. The strong consensus among the experimental and theoretical spectra suggests that the vdW interactions between MoS2 and adjacent SiO2 layers can influence the electronic structure of the system, manifesting a substantial electronic interaction at the MoS2-SiO2 interface. © | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | American Chemical Society | - |
dc.title | Direct Evidence of Electronic Interaction at the Atomic-Layer-Deposited MoS2Monolayer/SiO2Interface | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Park, Tae joo | - |
dc.identifier.doi | 10.1021/acsami.0c17544 | - |
dc.identifier.scopusid | 2-s2.0-85096504272 | - |
dc.identifier.wosid | 000596876400027 | - |
dc.identifier.bibliographicCitation | ACS Applied Materials and Interfaces, v.12, no.48, pp.53852 - 53859 | - |
dc.relation.isPartOf | ACS Applied Materials and Interfaces | - |
dc.citation.title | ACS Applied Materials and Interfaces | - |
dc.citation.volume | 12 | - |
dc.citation.number | 48 | - |
dc.citation.startPage | 53852 | - |
dc.citation.endPage | 53859 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.subject.keywordPlus | Atomic layer deposition | - |
dc.subject.keywordPlus | Electronic structure | - |
dc.subject.keywordPlus | Layered semiconductors | - |
dc.subject.keywordPlus | Photons | - |
dc.subject.keywordPlus | Silica | - |
dc.subject.keywordPlus | Silicon | - |
dc.subject.keywordPlus | Van der Waals forces | - |
dc.subject.keywordPlus | X ray absorption spectroscopy | - |
dc.subject.keywordPlus | X ray photoelectron spectroscopy | - |
dc.subject.keywordPlus | Angle-dependent | - |
dc.subject.keywordPlus | Atomic layer deposited | - |
dc.subject.keywordPlus | Electronic interactions | - |
dc.subject.keywordPlus | Experimental spectra | - |
dc.subject.keywordPlus | Photon energy | - |
dc.subject.keywordPlus | Synchrotron X-ray photoelectron spectroscopies | - |
dc.subject.keywordPlus | Theoretical spectra | - |
dc.subject.keywordPlus | Van der Waals interaction | - |
dc.subject.keywordPlus | Molybdenum compounds | - |
dc.subject.keywordAuthor | electronic structure | - |
dc.subject.keywordAuthor | interface | - |
dc.subject.keywordAuthor | MoS2 | - |
dc.subject.keywordAuthor | SiO2 | - |
dc.subject.keywordAuthor | synchrotron X-ray photoelectron spectroscopy | - |
dc.subject.keywordAuthor | van der Waals interaction | - |
dc.subject.keywordAuthor | X-ray absorption spectroscopy | - |
dc.identifier.url | https://pubs.acs.org/doi/10.1021/acsami.0c17544 | - |
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