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Effects of the fluctuation in a singly-connected conducting filament structure on the distribution of the reset parameters in unipolar resistance switching
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Na, Sang-Chul | - |
| dc.contributor.author | Lee, Keundong | - |
| dc.contributor.author | Chun, Min Chul | - |
| dc.contributor.author | Kwon, Young-Sun | - |
| dc.contributor.author | Shin, Hye-Jin | - |
| dc.contributor.author | Lee, Sangik | - |
| dc.contributor.author | Park, Bae Ho | - |
| dc.contributor.author | Kang, Bo Soo | - |
| dc.date.accessioned | 2021-06-22T20:22:28Z | - |
| dc.date.available | 2021-06-22T20:22:28Z | - |
| dc.date.created | 2021-01-21 | - |
| dc.date.issued | 2015-03 | - |
| dc.identifier.issn | 0003-6951 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/18775 | - |
| dc.description.abstract | The reset current (I-reset), voltage (V-reset), and resistance of the low resistance state, as functions of the compliance current (CC), were investigated in a Pt/NiO/Pt structure that showed unipolar resistance switching. Interestingly, the I-reset and the V-reset measured at low CCs were found to be widely distributed. In order to explain the behavior of the reset parameters for the singly-connected conducting filament (CF) structure, a simple model of CFs was employed whose width variation follows the Gaussian distribution. The wide distribution of the reset parameters can be attributed to the fluctuation in the number and/or the width of the CFs. (C) 2015 AIP Publishing LLC. | - |
| dc.language | 영어 | - |
| dc.language.iso | en | - |
| dc.publisher | AMER INST PHYSICS | - |
| dc.title | Effects of the fluctuation in a singly-connected conducting filament structure on the distribution of the reset parameters in unipolar resistance switching | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Kang, Bo Soo | - |
| dc.identifier.doi | 10.1063/1.4916742 | - |
| dc.identifier.scopusid | 2-s2.0-84926433585 | - |
| dc.identifier.wosid | 000352310700054 | - |
| dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.106, no.13, pp.1 - 5 | - |
| dc.relation.isPartOf | APPLIED PHYSICS LETTERS | - |
| dc.citation.title | APPLIED PHYSICS LETTERS | - |
| dc.citation.volume | 106 | - |
| dc.citation.number | 13 | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 5 | - |
| dc.type.rims | ART | - |
| dc.type.docType | Article | - |
| dc.description.journalClass | 1 | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordPlus | TRANSITION-METAL OXIDES | - |
| dc.subject.keywordPlus | PT/NIO/PT | - |
| dc.identifier.url | https://aip.scitation.org/doi/10.1063/1.4916742 | - |
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Related Researcher
- Kang, Bo Soo
- COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY (DEPARTMENT OF APPLIED PHYSICS)