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반도체 테스트 동향 및 이슈
- Authors
- 백상현
- Issue Date
- 3-Apr-2013
- Place
- 수원 서울대 차세대융합기술연구원 컨퍼런스룸1(A101호)
- Conference Name
- 반도체 기술 및 산업 동향 콜로키움 [반도체 package, test 기술 및 산업 전망]
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Related Researcher
- Baeg, Sanghyeon
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)