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Memory Reliability Model for Accumulated and Clustered Soft Errors
- Authors
- 백상현
- Issue Date
- 20-Oct-2010
- Place
- Stanford Sierra Conference Center, CA., USA
- Conference Name
- IEEE International Integrated Reliability Workshop
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Related Researcher
- Baeg, Sanghyeon
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)