FIR을 이용한 Demerit-CUSUM 관리도

Abstract

Complex Products may present more than one type of defects. Demerit system is a very effective tool to monitoring the different types of defects. So, this system used to monitor counts of several different types of defects simultaneously in a complex products. S.M. Na et al. (2003) proposed the Demerit-CUSUM for the improvement of performance and G.Y. Cho et al. (2004) developed a Demerit control chart using the EWMA scheme. In this paper, we present an effective method for process control using the Demerit-CUSUM by fast initial response and compare exact performance of classical demerit system, Demerit-CUSUM and Demerit-EWMA according to changing sample size and parameters.