Impedance spectroscopy of resistance switching in a Pt/NiO/Pt capacitor
DC Field | Value | Language |
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dc.contributor.author | Na, Sang-Chul | - |
dc.contributor.author | Chun, Min Chul | - |
dc.contributor.author | Kim, Jae-Jun | - |
dc.contributor.author | Shon, Jungwook | - |
dc.contributor.author | Jo, Sunkak | - |
dc.contributor.author | Kim, Hyunjin | - |
dc.contributor.author | Kang, Bo Soo | - |
dc.date.accessioned | 2021-06-23T02:03:23Z | - |
dc.date.available | 2021-06-23T02:03:23Z | - |
dc.date.created | 2021-01-21 | - |
dc.date.issued | 2013-12 | - |
dc.identifier.issn | 0374-4884 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/26286 | - |
dc.description.abstract | A unipolar resistance switching (URS) Pt/NiO/Pt thin film structure was successfully deposited by sputtering. Each state was analyzed by using impedance spectroscopy. The equivalent circuit of the pristine state consists of resistor-capacitor parallel circuit. The low-resistance state could be described by using a single resistor. The high-resistance state comprised parallelly-connected resistor and constant-phase element, plus a serial inductor. Our results are in good agreement with a model for the formation/rupture of conducting filaments in the URS phenomenon. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | KOREAN PHYSICAL SOC | - |
dc.title | Impedance spectroscopy of resistance switching in a Pt/NiO/Pt capacitor | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kang, Bo Soo | - |
dc.identifier.doi | 10.3938/jkps.63.2277 | - |
dc.identifier.scopusid | 2-s2.0-84891321377 | - |
dc.identifier.wosid | 000329104600001 | - |
dc.identifier.bibliographicCitation | JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.63, no.12, pp.2277 - 2280 | - |
dc.relation.isPartOf | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.citation.title | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.citation.volume | 63 | - |
dc.citation.number | 12 | - |
dc.citation.startPage | 2277 | - |
dc.citation.endPage | 2280 | - |
dc.type.rims | ART | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.identifier.kciid | ART001844387 | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Physics, Multidisciplinary | - |
dc.subject.keywordPlus | DEVICES | - |
dc.subject.keywordAuthor | Resistance switching | - |
dc.subject.keywordAuthor | Impedance spectroscopy | - |
dc.subject.keywordAuthor | NiO thin film | - |
dc.identifier.url | https://link.springer.com/article/10.3938/jkps.63.2277 | - |
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