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Memory Test Strategies in SoC (Embedded Memories)
- Authors
- 백상현
- Issue Date
- 30-Jun-2006
- Place
- 서울교육문화회관 별관 3층 동강홀
- Conference Name
- 한국 테스트 학술대회
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Related Researcher
- Baeg, Sanghyeon
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)