Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Simulation of DC Electric Fields on the Layer Structure of PPLP for Butt-Gap Conditions in HVDC MI-PPLP Cable

Full metadata record
DC Field Value Language
dc.contributor.authorHwang, Jae-Sang-
dc.contributor.authorKwon, Ik-Soo-
dc.contributor.authorLee, Bang-Wook-
dc.contributor.authorJung, Chae-Kyun-
dc.date.accessioned2021-06-22T10:03:18Z-
dc.date.available2021-06-22T10:03:18Z-
dc.date.created2021-01-21-
dc.date.issued2019-05-
dc.identifier.issn1975-0102-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/2990-
dc.description.abstractThe electric and thermal properties of HVDC MI-PPLP cable have recently been improved such as dielectric performance and maximum allowable temperature. However, its de electric field characteristics have not been fully investigated. As a lapped cable, its main insulating material is PPLP, which has a special composition of Kraft-PP film-Kraft. This prevents conventional de electric field analysis for the bulk type model from being directly applied to HVDC MI-PPLP cable. Therefore, the layer structure should be considered for HVDC MI-PPLP cable. In this paper, we focused on the difference in the de electric field properties between the bulk and layer type model, which were determined at a steady state and polarity reversal. In order to determine the difference in the number of the butt-gap, single and double butt-gaps were simulated and compared in terms of the butt-gap conditions. Particularly for the double butt-gap, it was possible to investigate the effects of size, position, and formations using de electric field simulation. Based on the de electric field analysis, meaningful information about the butt-gap characteristics of HVDC MI-PPLP cables was obtained.-
dc.language영어-
dc.language.isoen-
dc.publisher대한전기학회-
dc.titleSimulation of DC Electric Fields on the Layer Structure of PPLP for Butt-Gap Conditions in HVDC MI-PPLP Cable-
dc.typeArticle-
dc.contributor.affiliatedAuthorLee, Bang-Wook-
dc.identifier.doi10.1007/s42835-019-00152-7-
dc.identifier.scopusid2-s2.0-85064610410-
dc.identifier.wosid000466448400032-
dc.identifier.bibliographicCitationJournal of Electrical Engineering & Technology, v.14, no.3, pp.1335 - 1345-
dc.relation.isPartOfJournal of Electrical Engineering & Technology-
dc.citation.titleJournal of Electrical Engineering & Technology-
dc.citation.volume14-
dc.citation.number3-
dc.citation.startPage1335-
dc.citation.endPage1345-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.identifier.kciidART002463848-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusINSULATION-
dc.subject.keywordAuthorButt-gap-
dc.subject.keywordAuthorDC electric field analysis-
dc.subject.keywordAuthorHVDC MI-PPLP cables-
dc.subject.keywordAuthorLayer structure-
dc.identifier.urlhttps://link.springer.com/article/10.1007/s42835-019-00152-7-
Files in This Item
Go to Link
Appears in
Collections
COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Lee, Bang Wook photo

Lee, Bang Wook
ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)
Read more

Altmetrics

Total Views & Downloads

BROWSE