Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Efficient performance evaluation of high-speed differential interconnect lines with via discontinuities

Full metadata record
DC Field Value Language
dc.contributor.authorKim, Hyewon-
dc.contributor.authorLee, Junghyun-
dc.contributor.authorEo, Yungseon-
dc.date.accessioned2021-06-23T05:24:54Z-
dc.date.available2021-06-23T05:24:54Z-
dc.date.issued2013-10-
dc.identifier.issn2165-4107-
dc.identifier.issn2165-4115-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/30572-
dc.description.abstractVias in transmission lines cause significant waveform distortion due to electromagnetic wave reflections and vias may behavior like a band rejection filter due to resonances in between reference planes. These undesirable effects significantly exacerbate the signal integrity in high-speed and high-frequency integrated circuits, packaged modules, or printed circuit board (PCB). In this work, discontinuous interconnect lines including vias are experimentally characterized with S-parameter measurements in the frequency range of 10 MHz to 40 GHz. Then base on the experimental characterizations, an accurate circuit model to represent electrical characteristics of the vias is developed. It is shown that with the proposed technique, the high-performance integrated system can be efficiently designed by avoiding the conventional strict layout design rules for the discontinuous lines. © 2013 IEEE.-
dc.format.extent4-
dc.language영어-
dc.language.isoENG-
dc.publisherIEEE Computer Society-
dc.titleEfficient performance evaluation of high-speed differential interconnect lines with via discontinuities-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1109/EPEPS.2013.6703500-
dc.identifier.scopusid2-s2.0-84893612963-
dc.identifier.bibliographicCitation2013 IEEE 22nd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2013, pp 207 - 210-
dc.citation.title2013 IEEE 22nd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2013-
dc.citation.startPage207-
dc.citation.endPage210-
dc.type.docTypeConference Paper-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassother-
dc.subject.keywordPlusCircuit simulation-
dc.subject.keywordPlusResonance-
dc.subject.keywordPlusScattering parameters-
dc.subject.keywordPlusCircuit modeling-
dc.subject.keywordPlusElectrical characteristic-
dc.subject.keywordPlusExperimental characterization-
dc.subject.keywordPlusPrinted circuit boards (PCB)-
dc.subject.keywordPlusS-Parameter measurements-
dc.subject.keywordPlusSignal Integrity-
dc.subject.keywordPlusvias-
dc.subject.keywordPlusWaveform distortions-
dc.subject.keywordPlusElectronics packaging-
dc.subject.keywordAuthorCircuit model-
dc.subject.keywordAuthorresonance-
dc.subject.keywordAuthorscattering parameters-
dc.subject.keywordAuthorsignal integrity-
dc.subject.keywordAuthorvias-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/6703500-
Files in This Item
Go to Link
Appears in
Collections
COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher EO, YUNG SEON photo

EO, YUNG SEON
ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)
Read more

Altmetrics

Total Views & Downloads

BROWSE