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100nm 표준입자를 이용한 미분형 전기 이동도 분석기의 교정 및 불확실도 측정
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 안강호 | - |
| dc.date.accessioned | 2021-06-23T05:53:40Z | - |
| dc.date.available | 2021-06-23T05:53:40Z | - |
| dc.date.created | 2020-12-17 | - |
| dc.date.issued | 2003-07-03 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/31249 | - |
| dc.publisher | KAPAR | - |
| dc.title | 100nm 표준입자를 이용한 미분형 전기 이동도 분석기의 교정 및 불확실도 측정 | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | 안강호 | - |
| dc.identifier.bibliographicCitation | The 4th Korean Conference on Aerosl and Particle Technology | - |
| dc.relation.isPartOf | The 4th Korean Conference on Aerosl and Particle Technology | - |
| dc.citation.title | The 4th Korean Conference on Aerosl and Particle Technology | - |
| dc.citation.conferencePlace | 용평 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 2 | - |
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