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100nm 표준입자를 이용한 미분형 전기 이동도 분석기의 교정 및 불확실도 측정
- Authors
- 안강호
- Issue Date
- 3-Jul-2003
- Publisher
- KAPAR
- Citation
- The 4th Korean Conference on Aerosl and Particle Technology
- Conference Name
- The 4th Korean Conference on Aerosl and Particle Technology
- Place
- 용평
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