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Effects of lattice mismatches in ZnO/Substrate structures on the orientation of ZnO films and the characteristics of SAW devices
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박진석 | - |
| dc.date.accessioned | 2021-06-23T06:08:41Z | - |
| dc.date.available | 2021-06-23T06:08:41Z | - |
| dc.date.issued | 2003-04-28 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/31456 | - |
| dc.title | Effects of lattice mismatches in ZnO/Substrate structures on the orientation of ZnO films and the characteristics of SAW devices | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | ICMCTF 2003 | - |
| dc.citation.conferencePlace | San Diego, USA | - |
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- PARK, JIN SEOK
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)