Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Understanding NBIS Mechanism of a-IGZO TFTs by Pulsed Stress Measurements Using Various Voltage and Light Pulse Widths
- Authors
- 오새룬터
- Issue Date
- 20200214
- Place
- 강원도 하이원리조트
- Conference Name
- 제27회 한국반도체학술대회
- Files in This Item
- There are no files associated with this item.
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.