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실리콘 기판 효과를 고려한 전송선 파라미터 추출및 신호천이
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 어영선 | - |
| dc.date.accessioned | 2021-06-23T08:33:28Z | - |
| dc.date.available | 2021-06-23T08:33:28Z | - |
| dc.date.issued | 1998-06-27 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/34638 | - |
| dc.description.abstract | A new transmission line parameter extraction method of IC interconnects on silicon substrate is presented. To extract the accurate parameters, the silicon substrate effects were kaken into account. | - |
| dc.title | 실리콘 기판 효과를 고려한 전송선 파라미터 추출및 신호천이 | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 대한전자공학회 하계 학술대회 | - |
| dc.citation.conferencePlace | 경남대 | - |
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Related Researcher
- EO, YUNG SEON
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)