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Structural characterization of fluorinated thin films on aluminum surface by attenuated total reflectance FT-IR spectro-photometry
- Authors
- 박진구
- Issue Date
- 1-Apr-1998
- Conference Name
- 대한화학회
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Related Researcher
- Park, Jin Goo
- ERICA 공학대학 (DEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING)