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미세공정 상의 DDR3 디-램(DRAM)에서 발생하는 로우 해머(Row Hammer)로 인한 폴트(Fault)를 감소시키기 위한 방법The methodology for reducing faults by Row Hammer stress in submicron DDR3 DRAM
- Alternative Title
- The methodology for reducing faults by Row Hammer stress in submicron DDR3 DRAM
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- 백상현[백상현]
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Collections - COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 4. Patents
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Related Researcher
- Baeg, Sanghyeon
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)