Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
고밀도 메모리 테스트를 위한 개선된 랜덤BIST의 구현
- Authors
- 박성주
- Issue Date
- 1-Jun-1997
- Publisher
- 대한전자공학회
- Citation
- 하계종합학술대회 논문집
- Conference Name
- 하계종합학술대회 논문집
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - COLLEGE OF COMPUTING > SCHOOL OF COMPUTER SCIENCE > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.