Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Intrinsic charge transport of conjugated organic molecules in electromigrated nanogap junctions

Full metadata record
DC Field Value Language
dc.contributor.authorSong, Hyunwook-
dc.contributor.authorKim, Youngsang-
dc.contributor.authorJeong, Heejun-
dc.contributor.authorReed, Mark A.-
dc.contributor.authorLee, Takhee-
dc.date.accessioned2021-06-23T10:42:39Z-
dc.date.available2021-06-23T10:42:39Z-
dc.date.created2021-01-21-
dc.date.issued2011-05-
dc.identifier.issn0021-8979-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/37449-
dc.description.abstractWe present the measurement of charge transport through phenylene conjugated molecules using electromigrated nanogap junctions. To elucidate the intrinsic transport properties of the conjugated molecular junctions, a variety of molecular transport techniques were performed at low temperature, including inelastic electron tunneling spectroscopy, temperature- and length-variable transport measurements, and transition voltage spectroscopy. Such a self-consistent characterization of the molecular junction demonstrates the observation of intrinsic molecular properties in these junctions. (C) 2011 American Institute of Physics. [doi :10.1063/1.3578345]-
dc.language영어-
dc.language.isoen-
dc.publisherAmerican Institute of Physics-
dc.titleIntrinsic charge transport of conjugated organic molecules in electromigrated nanogap junctions-
dc.typeArticle-
dc.contributor.affiliatedAuthorJeong, Heejun-
dc.identifier.doi10.1063/1.3578345-
dc.identifier.scopusid2-s2.0-79958818516-
dc.identifier.wosid000292115900020-
dc.identifier.bibliographicCitationJournal of Applied Physics, v.109, no.10, pp.1 - 5-
dc.relation.isPartOfJournal of Applied Physics-
dc.citation.titleJournal of Applied Physics-
dc.citation.volume109-
dc.citation.number10-
dc.citation.startPage1-
dc.citation.endPage5-
dc.type.rimsART-
dc.type.docTypeArticle; Proceedings Paper-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusELECTRON-TRANSPORT-
dc.subject.keywordPlusMETAL JUNCTIONS-
dc.subject.keywordPlusCONDUCTION-
dc.subject.keywordPlusFABRICATION-
dc.subject.keywordAuthorSELF-ASSEMBLED MONOLAYERS-
dc.subject.keywordAuthorATOMIC-FORCE MICROSCOPY-
dc.subject.keywordAuthorSPECTROSCOPY-
dc.subject.keywordAuthorCONDUCTION-
dc.subject.keywordAuthorFABRICATION-
dc.subject.keywordAuthorMETAL JUNCTIONS-
dc.subject.keywordAuthorELECTRON-TRANSPORT-
dc.identifier.urlhttps://aip.scitation.org/doi/10.1063/1.3578345-
Files in This Item
Go to Link
Appears in
Collections
COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY > DEPARTMENT OF APPLIED PHYSICS > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Jeong, Hee jun photo

Jeong, Hee jun
COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY (DEPARTMENT OF APPLIED PHYSICS)
Read more

Altmetrics

Total Views & Downloads

BROWSE