Intrinsic charge transport of conjugated organic molecules in electromigrated nanogap junctions
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Song, Hyunwook | - |
dc.contributor.author | Kim, Youngsang | - |
dc.contributor.author | Jeong, Heejun | - |
dc.contributor.author | Reed, Mark A. | - |
dc.contributor.author | Lee, Takhee | - |
dc.date.accessioned | 2021-06-23T10:42:39Z | - |
dc.date.available | 2021-06-23T10:42:39Z | - |
dc.date.created | 2021-01-21 | - |
dc.date.issued | 2011-05 | - |
dc.identifier.issn | 0021-8979 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/37449 | - |
dc.description.abstract | We present the measurement of charge transport through phenylene conjugated molecules using electromigrated nanogap junctions. To elucidate the intrinsic transport properties of the conjugated molecular junctions, a variety of molecular transport techniques were performed at low temperature, including inelastic electron tunneling spectroscopy, temperature- and length-variable transport measurements, and transition voltage spectroscopy. Such a self-consistent characterization of the molecular junction demonstrates the observation of intrinsic molecular properties in these junctions. (C) 2011 American Institute of Physics. [doi :10.1063/1.3578345] | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | American Institute of Physics | - |
dc.title | Intrinsic charge transport of conjugated organic molecules in electromigrated nanogap junctions | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Jeong, Heejun | - |
dc.identifier.doi | 10.1063/1.3578345 | - |
dc.identifier.scopusid | 2-s2.0-79958818516 | - |
dc.identifier.wosid | 000292115900020 | - |
dc.identifier.bibliographicCitation | Journal of Applied Physics, v.109, no.10, pp.1 - 5 | - |
dc.relation.isPartOf | Journal of Applied Physics | - |
dc.citation.title | Journal of Applied Physics | - |
dc.citation.volume | 109 | - |
dc.citation.number | 10 | - |
dc.citation.startPage | 1 | - |
dc.citation.endPage | 5 | - |
dc.type.rims | ART | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | ELECTRON-TRANSPORT | - |
dc.subject.keywordPlus | METAL JUNCTIONS | - |
dc.subject.keywordPlus | CONDUCTION | - |
dc.subject.keywordPlus | FABRICATION | - |
dc.subject.keywordAuthor | SELF-ASSEMBLED MONOLAYERS | - |
dc.subject.keywordAuthor | ATOMIC-FORCE MICROSCOPY | - |
dc.subject.keywordAuthor | SPECTROSCOPY | - |
dc.subject.keywordAuthor | CONDUCTION | - |
dc.subject.keywordAuthor | FABRICATION | - |
dc.subject.keywordAuthor | METAL JUNCTIONS | - |
dc.subject.keywordAuthor | ELECTRON-TRANSPORT | - |
dc.identifier.url | https://aip.scitation.org/doi/10.1063/1.3578345 | - |
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