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Noise characteristics of sub-micron gateAaAs MESFETs and pseudomorpgicHEMTs and the influence of the gateleakage current on thein performance
- Authors
- 오재응
- Issue Date
- 1-Feb-1995
- Publisher
- 한국 과학 기술원
- Citation
- 제 2회 반도체 학술대회 논문집
- Conference Name
- 제 2회 반도체 학술대회 논문집
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