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An Interconnect Test Generation Tool for IEEE 1149.1 and IBM Boundary Scan Chips
- Authors
- 박성주
- Issue Date
- 1-Oct-1993
- Publisher
- IBM
- Citation
- Proceeding of IBM Inte. TestConference
- Conference Name
- Proceeding of IBM Inte. TestConference
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - COLLEGE OF COMPUTING > SCHOOL OF COMPUTER SCIENCE > 2. Conference Papers
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