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Laser marking 기술을 이용한 EL 특성측정 장치
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 심종인[심종인] | - |
| dc.date.accessioned | 2021-06-23T10:49:36Z | - |
| dc.date.available | 2021-06-23T10:49:36Z | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/37809 | - |
| dc.title | Laser marking 기술을 이용한 EL 특성측정 장치 | - |
| dc.title.alternative | Equipment for measurement of elecroluminescence characteristic by using laser marking technique on LED wafer | - |
| dc.type | Patent | - |
| dc.contributor.affiliatedAuthor | 심종인[심종인] | - |
| dc.type.rims | PAT | - |
| dc.type.iprs | 특허 | - |
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Related Researcher
- Shim, Jong In
- COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY (DEPARTMENT OF PHOTONICS AND NANOELECTRONICS)