온/오프 버스 브리지를 이용한 칩 테스트 방법 및 장치

박성주[박성주]

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온/오프 버스 브리지를 이용한 칩 테스트 방법 및 장치

Authors: 박성주[박성주]

URI: https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/38032

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Appears in Collections: COLLEGE OF COMPUTING > SCHOOL OF COMPUTER SCIENCE > 4. Patents

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