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Thermal stability of stuffed TiN/Tidiffusion barriers formed underdifferrnt thermol history withAi:1% Si everlayers and Si substrates

Authors
오재응
Issue Date
1-Jan-1992
Publisher
대한 전자 공학회
Citation
전자 공학회 춘계 학술대회
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/38466
Conference Name
전자 공학회 춘계 학술대회
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COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 2. Conference Papers

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