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Inhomogeneous carrier distribution in InGaN multiple quantum wells and its influences on device performances

Authors
Ryu, Han-YoulShim, Jong-In
Issue Date
Mar-2011
Publisher
SPIE
Keywords
carrier distribution; efficiency droop; InGaN; Light-emitting diode; quantum well
Citation
Proceedings of SPIE - The International Society for Optical Engineering, v.7939, pp 1 - 10
Pages
10
Indexed
SCIE
SCOPUS
Journal Title
Proceedings of SPIE - The International Society for Optical Engineering
Volume
7939
Start Page
1
End Page
10
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/39121
DOI
10.1117/12.874105
ISSN
0277-786X
Abstract
We investigate the effect of carrier distribution characteristics in InGaN multiple-quantum-well (MQW) structures on the efficiency droop of light-emitting diodes (LEDs). Here, three kinds of inhomogeneous carrier distributions are studied; inhomogeneous carrier distribution in the vertical direction between QWs, that in the horizontal direction of a QW plane due to the current crowding in the LED chip, and that inside QW materials by carrier localization in the Inrich areas. It is found, by numerical simulation, that the built-in polarization field in InGaN MQWs makes the hole distribution between QWs more inhomogeneous, which enhances the efficiency droop. In addition, nonuniform current spreading is also found to have a significant influence on the efficiency droop by the inhomogenous carrier distribution in the plane of a QW. When the carrier distribution characteristic is investigated in a microscopic scale, the localization of carriers in the In-rich areas is expected to reduce the effective active volume where carriers are able to recombine, and enhances the efficiency droop due to the large increase in the carrier density at inhomogeneously distributed In-rich regions. © 2011 SPIE.
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COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY (DEPARTMENT OF PHOTONICS AND NANOELECTRONICS)
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