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Electrochemical impedance spectroscopy (EIS) analysis of BTA removal by TMAH during post Cu CMP cleaning process

Authors
Prasanna, Venkatesh RajaramanKim, Hyuk minRamanathan, SrinivasanPark, Jin-Goo
Issue Date
Oct-2011
Publisher
Electrochemical Society, Inc.
Citation
ECS Transactions, v.41, no.5, pp 323 - 330
Pages
8
Indexed
SCIE
SCOPUS
Journal Title
ECS Transactions
Volume
41
Number
5
Start Page
323
End Page
330
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/39157
DOI
10.1149/1.3630860
ISSN
1938-5862
1938-6737
Abstract
In the present study, the efficiency of TMAH in removing BTA organic layer from Cu surface is evaluated through electrochemical impedance spectroscopy studies. As the conventional EIS measurements could not be applied in situ to study the cleaning system, a modified EIS experimental procedure is adopted in the present work. The impedance data is validated by Kramers Kronig transform (KKT) and modeled by electrical equivalent circuit (EEC) model. Contact angle measurements were also conducted to complement the studies. The results show that a minimum concentration of 0.5 wt % TMAH is required for complete removal of BTA from the Cu surface. ©The Electrochemical Society.
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ERICA 공학대학 (DEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING)
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