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Resistive switching transition induced by a voltage pulse in a Pt/NiO/Pt structure

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dc.contributor.authorHwang, Inrok-
dc.contributor.authorLee, Myung-Jae-
dc.contributor.authorBuh, Gyoung-Ho-
dc.contributor.authorBae, Jieun-
dc.contributor.authorChoi, Jinsik-
dc.contributor.authorKim, Jin-Soo-
dc.contributor.authorHong, Sahwan-
dc.contributor.authorKim, Yeon Soo-
dc.contributor.authorByun, Ik-Su-
dc.contributor.authorLee, Seung-Woong-
dc.contributor.authorAhn, Seung-Eon-
dc.contributor.authorKang, Bo Soo-
dc.contributor.authorKang, Sung-Oong-
dc.contributor.authorPark, Bae Ho-
dc.date.accessioned2021-06-23T13:01:53Z-
dc.date.available2021-06-23T13:01:53Z-
dc.date.created2021-01-21-
dc.date.issued2010-08-
dc.identifier.issn0003-6951-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/39593-
dc.description.abstractWe have observed a switching transition between bistable memory switching and monostable threshold switching in Pt/NiO/Pt structure. Bistable memory switching could be changed to monostable threshold switching by applying a positive electrical pulse with height of 2 V and width between 10(-2) and 10(-4) s. The change is reversible by applying a negative electrical pulse with the same height and width. By considering polarity-and width-dependence of the switching transition and compositional difference on electrical properties in NiOx, we have proposed a model in which the migration of oxygen ions (O2-) is responsible for the switching transition in Pt/NiO/Pt structures. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3477953]-
dc.language영어-
dc.language.isoen-
dc.publisherAMER INST PHYSICS-
dc.titleResistive switching transition induced by a voltage pulse in a Pt/NiO/Pt structure-
dc.typeArticle-
dc.contributor.affiliatedAuthorKang, Bo Soo-
dc.identifier.doi10.1063/1.3477953-
dc.identifier.scopusid2-s2.0-77955744722-
dc.identifier.wosid000281059500029-
dc.identifier.bibliographicCitationAPPLIED PHYSICS LETTERS, v.97, no.5, pp.1 - 4-
dc.relation.isPartOfAPPLIED PHYSICS LETTERS-
dc.citation.titleAPPLIED PHYSICS LETTERS-
dc.citation.volume97-
dc.citation.number5-
dc.citation.startPage1-
dc.citation.endPage4-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusNONVOLATILE MEMORY-
dc.subject.keywordPlusFILMS-
dc.subject.keywordAuthorFILMS-
dc.subject.keywordAuthorNONVOLATILE MEMORY-
dc.identifier.urlhttps://aip.scitation.org/doi/10.1063/1.3477953-
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