Noise Characteristics of Charge Tunneling via Localized States in Metal-Molecule-Metal Junctions
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Youngsang | - |
dc.contributor.author | Song, Hyunwook | - |
dc.contributor.author | Kim, Dongwoo | - |
dc.contributor.author | Lee, Takhee | - |
dc.contributor.author | Jeong, Heejun | - |
dc.date.accessioned | 2021-06-23T13:02:35Z | - |
dc.date.available | 2021-06-23T13:02:35Z | - |
dc.date.created | 2021-01-21 | - |
dc.date.issued | 2010-08 | - |
dc.identifier.issn | 1936-0851 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/39624 | - |
dc.description.abstract | We report the noise characteristics of charge transport through an alkyl-based metal-molecule-metal junction. Measurements of the 1/f noise, random telegraph noise, and shot noise demonstrated the existence of localized traps in the molecular junctions. These three noise measurements exhibited results consistent with trap-mediated tunneling activated over similar to 0.4 V by trapping and detrapping processes via localized states (or defects). The noise characterizations will be useful in evaluating the influences of localized states on charge transport in molecular or other electronic junctions. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | American Chemical Society | - |
dc.title | Noise Characteristics of Charge Tunneling via Localized States in Metal-Molecule-Metal Junctions | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Jeong, Heejun | - |
dc.identifier.doi | 10.1021/nn100255b | - |
dc.identifier.scopusid | 2-s2.0-78650104239 | - |
dc.identifier.wosid | 000281052700013 | - |
dc.identifier.bibliographicCitation | ACS Nano, v.4, no.8, pp.4426 - 4430 | - |
dc.relation.isPartOf | ACS Nano | - |
dc.citation.title | ACS Nano | - |
dc.citation.volume | 4 | - |
dc.citation.number | 8 | - |
dc.citation.startPage | 4426 | - |
dc.citation.endPage | 4430 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Physical | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.subject.keywordPlus | SELF-ASSEMBLED MONOLAYERS | - |
dc.subject.keywordPlus | SHOT-NOISE | - |
dc.subject.keywordPlus | ELECTRON-TRANSPORT | - |
dc.subject.keywordAuthor | molecular junctions | - |
dc.subject.keywordAuthor | localized states | - |
dc.subject.keywordAuthor | 1/f noise | - |
dc.subject.keywordAuthor | random telegraph noise | - |
dc.subject.keywordAuthor | shot noise | - |
dc.identifier.url | https://pubs.acs.org/doi/10.1021/nn100255b | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
55 Hanyangdeahak-ro, Sangnok-gu, Ansan, Gyeonggi-do, 15588, Korea+82-31-400-4269 sweetbrain@hanyang.ac.kr
COPYRIGHT © 2021 HANYANG UNIVERSITY. ALL RIGHTS RESERVED.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.