Warm-up and Cool-down Characteristics of Cryogenic Insulation Materials in Liquid Nitrogen

Abstract

Among the various factors influencing the service life of the electric equipment, the performance of dielectric insulation materials has an important role to determine their whole service life. In order to determine the degradation of insulating materials immersed in extremely low temperature media such as liquid nitrogen, the abrupt temperature change from cryogenic to normal room temperature should be considered. But the assessments of low-temperature aging test method for the dielectric materials immersed in liquid nitrogen considering these conditions were not fully reported. Therefore, for the fundamental step to establish the suitable degradation test methods for cryogenic dielectric materials, we focused on the evaluation of ageing test methods for dielectric materials exposed to low temperature environments considering thermal shock by cool-down and warm up test.