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반도체 메모리에서 발생하는 소프트에러에 대한 소개
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 백상현 | - |
| dc.date.accessioned | 2021-06-23T13:39:42Z | - |
| dc.date.available | 2021-06-23T13:39:42Z | - |
| dc.date.issued | 2010-01 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/40023 | - |
| dc.format.extent | 6 | - |
| dc.language | 한국어 | - |
| dc.language.iso | KOR | - |
| dc.publisher | 한국테스트협회 | - |
| dc.title | 반도체 메모리에서 발생하는 소프트에러에 대한 소개 | - |
| dc.type | Article | - |
| dc.publisher.location | 대한민국 | - |
| dc.identifier.bibliographicCitation | 한국테스트협회논문집, v.2, no.4, pp 208 - 213 | - |
| dc.citation.title | 한국테스트협회논문집 | - |
| dc.citation.volume | 2 | - |
| dc.citation.number | 4 | - |
| dc.citation.startPage | 208 | - |
| dc.citation.endPage | 213 | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | domestic | - |
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Related Researcher
- Baeg, Sanghyeon
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)