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반도체 메모리에서 발생하는 소프트에러에 대한 소개
- Authors
- 백상현
- Issue Date
- Jan-2010
- Publisher
- 한국테스트협회
- Citation
- 한국테스트협회논문집, v.2, no.4, pp 208 - 213
- Pages
- 6
- Indexed
- DOMESTIC
- Journal Title
- 한국테스트협회논문집
- Volume
- 2
- Number
- 4
- Start Page
- 208
- End Page
- 213
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Related Researcher
- Baeg, Sanghyeon
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)