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Fast Eye Diagram Determination for the Signal Integrity Verification of Frequency-Variant transmission lines
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Hyunsik | - |
| dc.contributor.author | Kim, Dongchul | - |
| dc.contributor.author | Eo, Yungseon | - |
| dc.date.accessioned | 2021-06-23T14:41:12Z | - |
| dc.date.available | 2021-06-23T14:41:12Z | - |
| dc.date.issued | 2009-11 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/40693 | - |
| dc.description.abstract | A new efficient and accurate eye diagram determination technique is presented. In order to estimate the worst case eye diagram, bit streams which may induce the worst ISI (inter symbol interference) are determined. Then the output responses for worst case bit streams are determined by using fast Fourier transform technique. The proposed technique is compared with SPICE simulation that employs PRBS (pseudorandom bit sequence) input signals. | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | IEEE | - |
| dc.title | Fast Eye Diagram Determination for the Signal Integrity Verification of Frequency-Variant transmission lines | - |
| dc.type | Article | - |
| dc.identifier.doi | 10.1109/SOCDC.2009.5423860 | - |
| dc.identifier.scopusid | 2-s2.0-77951483755 | - |
| dc.identifier.bibliographicCitation | 2009 International SoC Design Conference | - |
| dc.citation.title | 2009 International SoC Design Conference | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | other | - |
| dc.subject.keywordAuthor | Eye-diagram | - |
| dc.subject.keywordAuthor | frequency-variant characteristics | - |
| dc.subject.keywordAuthor | signal integrity | - |
| dc.subject.keywordAuthor | signal transient response | - |
| dc.subject.keywordAuthor | transmission line | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/5423860 | - |
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Related Researcher
- EO, YUNG SEON
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)