고주파 측정기반 다층 PCB의 유효 유전상수 추출
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 김동철 | - |
dc.contributor.author | 김현 | - |
dc.contributor.author | 어영선 | - |
dc.date.accessioned | 2021-06-23T15:06:59Z | - |
dc.date.available | 2021-06-23T15:06:59Z | - |
dc.date.created | 2021-02-18 | - |
dc.date.issued | 2009-07 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/41046 | - |
dc.description.abstract | The effective dielectric constant of a multi-layered PCB is experimentally determined by using TDR/TDT and VNA measurements. Test transmission line patterns are designed with various lengths. For the sake of the effective dielectric constant determination, reflected wave delay and S-parameters are measured. Then, the effective dielectric constant is determined by using the measurement data. | - |
dc.language | 한국어 | - |
dc.language.iso | ko | - |
dc.publisher | 대한전자공학회 | - |
dc.title | 고주파 측정기반 다층 PCB의 유효 유전상수 추출 | - |
dc.title.alternative | Effective Dielectric Constant Extraction of Multi-Layered PCB Based on High-Frequency Measurements | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | 어영선 | - |
dc.identifier.bibliographicCitation | 2009년도 대한전자공학회 하계종합학술대회, pp.409 - 410 | - |
dc.relation.isPartOf | 2009년도 대한전자공학회 하계종합학술대회 | - |
dc.citation.title | 2009년도 대한전자공학회 하계종합학술대회 | - |
dc.citation.startPage | 409 | - |
dc.citation.endPage | 410 | - |
dc.type.rims | ART | - |
dc.description.journalClass | 3 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | other | - |
dc.identifier.url | https://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE01381169 | - |
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