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고주파 측정기반 다층 PCB의 유효 유전상수 추출

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dc.contributor.author김동철-
dc.contributor.author김현-
dc.contributor.author어영선-
dc.date.accessioned2021-06-23T15:06:59Z-
dc.date.available2021-06-23T15:06:59Z-
dc.date.created2021-02-18-
dc.date.issued2009-07-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/41046-
dc.description.abstractThe effective dielectric constant of a multi-layered PCB is experimentally determined by using TDR/TDT and VNA measurements. Test transmission line patterns are designed with various lengths. For the sake of the effective dielectric constant determination, reflected wave delay and S-parameters are measured. Then, the effective dielectric constant is determined by using the measurement data.-
dc.language한국어-
dc.language.isoko-
dc.publisher대한전자공학회-
dc.title고주파 측정기반 다층 PCB의 유효 유전상수 추출-
dc.title.alternativeEffective Dielectric Constant Extraction of Multi-Layered PCB Based on High-Frequency Measurements-
dc.typeArticle-
dc.contributor.affiliatedAuthor어영선-
dc.identifier.bibliographicCitation2009년도 대한전자공학회 하계종합학술대회, pp.409 - 410-
dc.relation.isPartOf2009년도 대한전자공학회 하계종합학술대회-
dc.citation.title2009년도 대한전자공학회 하계종합학술대회-
dc.citation.startPage409-
dc.citation.endPage410-
dc.type.rimsART-
dc.description.journalClass3-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassother-
dc.identifier.urlhttps://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE01381169-
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COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 1. Journal Articles

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ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)
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