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Embedded micro / nano channels formation for three-dimensional negative-tone photoresist microstructuring

Authors
Kim, Sang-KonOh, Hye-KeunJung, Young-DaeAn, Ilsin
Issue Date
Apr-2009
Publisher
SPIE
Keywords
Chemically amplified resist; Embedded channel; Inverse lithography; Lithography; Lithography simulation; MEMS; Multi-exposures; Negative resist
Citation
Proceedings of SPIE - The International Society for Optical Engineering, v.7273, pp 1 - 6
Pages
6
Indexed
SCOPUS
Journal Title
Proceedings of SPIE - The International Society for Optical Engineering
Volume
7273
Start Page
1
End Page
6
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/41792
DOI
10.1117/12.814244
ISSN
0277-786X
Abstract
Photoresist lithography has been applied in MEMS (micro electro mechanical systems). The flexible 3D (three dimensional) micro / nano fabrication technique and its process simulation tool have required for 3-D MEMS. This paper presents a UV lithography process simulation for the embedded micro / nano channel formation in a negative-tone photoresist. For its purpose, the moving-mask technology and lithography processes of the negative-tone chemically amplified photoresist are modeled. The simulation algorithm of nano-lithography is applied for micro-lithography. The validity of simulation for the proposed 3D microstructuring is successfully confirmed by the comparison between experimental results and simulated results. Hence, the developed modeling and simulation can discuss and optimize photoresist characteristics and lithography process conditions due to the various pattern formations of micro / nano channels. © 2009 SPIE.
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COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY > DEPARTMENT OF PHOTONICS AND NANOELECTRONICS > 1. Journal Articles
COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY > DEPARTMENT OF APPLIED PHYSICS > 1. Journal Articles

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