Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Surface Flaws Detection Using AC Magnetic Field Sensing by a Thin Film Inductive Microsensor

Full metadata record
DC Field Value Language
dc.contributor.authorCha, Yu-Jung-
dc.contributor.authorKim, Ki Hyeon-
dc.contributor.authorShon, Jong-Sik-
dc.contributor.authorKim, Young Ho-
dc.contributor.authorKim, Jongryoul-
dc.date.accessioned2021-06-23T17:03:24Z-
dc.date.available2021-06-23T17:03:24Z-
dc.date.created2021-01-21-
dc.date.issued2008-11-
dc.identifier.issn0018-9464-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/42078-
dc.description.abstractAlternating magnetic field was used for detection of surface flaws on conductive metallic specimens. The nondestructive sensor probe was composed of the planar coil with inductive magnetic thin film yoke as a sensing component and a single straight typed exciting coil. The planar inductive coil sensor with magnetic yoke was fabricated by sputtering, electroplating, dry etching, and photolithography process. The exciting coil was generated by the alternative current with the range of 0.1-1.2 A with frequency rage of 0.6-1.8 MHz, respectively, which alternating current (ac) magnetic fields by exciting coil were applied to the specimen with artificial flaws. The specimens were prepared with the slit shaped artificial surface flaws (minimum depth and width; 0.5 mm) on metallic plate (Al; nonmagnetic metal and FeC; magnetic metal). The detected signal for the positions and shapes of surface flaws on specimens were obtained with high sensitivity and high signal to ratio by the planar inductive microsensor probe. The measured output signals by the noncontacted scanning on surface of coins (one cent and two euros) were converted to the images of the flaws. These results were compared with the optical images of real coins, respectively.-
dc.language영어-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleSurface Flaws Detection Using AC Magnetic Field Sensing by a Thin Film Inductive Microsensor-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Jongryoul-
dc.identifier.doi10.1109/TMAG.2008.2002774-
dc.identifier.scopusid2-s2.0-77955155634-
dc.identifier.wosid000262221300168-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON MAGNETICS, v.44, no.11, pp.4022 - 4025-
dc.relation.isPartOfIEEE TRANSACTIONS ON MAGNETICS-
dc.citation.titleIEEE TRANSACTIONS ON MAGNETICS-
dc.citation.volume44-
dc.citation.number11-
dc.citation.startPage4022-
dc.citation.endPage4025-
dc.type.rimsART-
dc.type.docTypeArticle; Proceedings Paper-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusSENSORS-
dc.subject.keywordPlusCOIL-
dc.subject.keywordAuthorCoils-
dc.subject.keywordAuthorflaw detection-
dc.subject.keywordAuthorinductive transducers-
dc.subject.keywordAuthorsensors-
dc.subject.keywordAuthorsoft magnetic film-
dc.subject.keywordAuthorthin film devices-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/4717513-
Files in This Item
Go to Link
Appears in
Collections
COLLEGE OF ENGINEERING SCIENCES > DEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Kim, Jong ryoul photo

Kim, Jong ryoul
ERICA 공학대학 (DEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING)
Read more

Altmetrics

Total Views & Downloads

BROWSE