Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
RFID 시스템의 고장률에 대한 경쟁적 위험모형 개발Developing a Competing Risks Model for Failure Rate of RFID System
- Other Titles
- Developing a Competing Risks Model for Failure Rate of RFID System
- Issue Date
- May-2008
- Publisher
- 한국산업경영시스템학회
- Keywords
- series and parallel structure; Bayesian estimation; likelihood function
- Citation
- 한국산업경영시스템학회 학술대회, pp.166 - 173
- Indexed
- OTHER
- Journal Title
- 한국산업경영시스템학회 학술대회
- Start Page
- 166
- End Page
- 173
- Files in This Item
- Go to Link
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.