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Micromachined Si cantilever arrays for parallel AFM operation

Authors
Ahn, YoominOno, TakahitoEsashi, Masayoshi
Issue Date
Feb-2008
Publisher
KOREAN SOC MECHANICAL ENGINEERS
Keywords
atomic force microscopy; parallel AFM operations; Si cantilever array
Citation
JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY, v.22, no.2, pp.308 - 311
Indexed
SCIE
SCOPUS
KCI
Journal Title
JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY
Volume
22
Number
2
Start Page
308
End Page
311
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/42682
DOI
10.1007/s12206-007-1029-2
ISSN
1738-494X
Abstract
Silicon cantilever arrays with a very small pitch for parallel AFM operations were studied. We fabricated 1x104 in eight groups and 1x30 Si probe arrays and produced a smaller pitch (15 mu m) between probe tips by using Si anisotropic etching with a vertical wall shaped oxide mask. The vertical controls of Si probes were able to operate individually or in a group by integrating electrostatic actuators into the cantilevers of the probes. The fabricated Si cantilever arrays showed reasonable dynamic characteristics for the probe cantilever and reliable parallel operation of AFM.
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