Signal transient and crosstalk model of capacitively and inductively coupled VLSI interconnect lines

Abstract

Analytical compact form models for the signal transients and crosstalk noise of inductive-effectprominent multi-coupled RLC lines are developed. Capacitive and inductive coupling effects are investigated and formulated in terms of the equivalent transmission line model and transmission line parameters for fundamental modes. The signal transients and crosstalk noise expressions of two coupled lines are derived by using a wave-form approximation technique. It is shown that the models have excellent agreement with SPICE simulation.