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Highly Concurrent Test Access Mechanism for AMBA Based System-on-a-Chip

Authors
박성주
Issue Date
Feb-2007
Publisher
한국반도체협회
Citation
한국반도체 학술대회
Indexed
OTHER
Journal Title
한국반도체 학술대회
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/43859
Abstract
AMBA 기반 SOC 테스트 설계기술 개발
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COLLEGE OF COMPUTING > SCHOOL OF COMPUTER SCIENCE > 1. Journal Articles

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