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Improvement of Electrical Properties and Stability of ITZO(Indium-Tin-Zinc-Oxide) TFT(Thin Film Transistor) Using Oxygen Rapid Thermal Annealing
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 오새룬터 | - |
| dc.date.accessioned | 2021-06-22T10:45:53Z | - |
| dc.date.available | 2021-06-22T10:45:53Z | - |
| dc.date.issued | 20190829 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/4400 | - |
| dc.title | Improvement of Electrical Properties and Stability of ITZO(Indium-Tin-Zinc-Oxide) TFT(Thin Film Transistor) Using Oxygen Rapid Thermal Annealing | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | International Meeting on Information Display (IMID) | - |
| dc.citation.conferencePlace | 경주 HICO | - |
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