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Improvement of Electrical Properties and Stability of ITZO(Indium-Tin-Zinc-Oxide) TFT(Thin Film Transistor) Using Oxygen Rapid Thermal Annealing
- Authors
- 오새룬터
- Issue Date
- 20190829
- Place
- 경주 HICO
- Conference Name
- International Meeting on Information Display (IMID)
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