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A new method for measurement of the fundamental device parameters in a GaN-based light emitting diode
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Hyunsung | - |
| dc.contributor.author | Shim, Jong In | - |
| dc.date.accessioned | 2021-06-23T20:41:34Z | - |
| dc.date.available | 2021-06-23T20:41:34Z | - |
| dc.date.created | 2021-02-01 | - |
| dc.date.issued | 2007-08 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/44271 | - |
| dc.description.abstract | We propose a simple and new method which is able to characterize internal device parameters such as the internal quantum efficiency, nonradiative recombination rate, radiative recombination rate, and the internal carrier density in a light emitting diode. The method utilizes measurements of both the power versus current curve and the carrier lifetime. | - |
| dc.language | 영어 | - |
| dc.language.iso | en | - |
| dc.publisher | IEEE | - |
| dc.title | A new method for measurement of the fundamental device parameters in a GaN-based light emitting diode | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Shim, Jong In | - |
| dc.identifier.doi | 10.1109/CLEOPR.2007.4391579 | - |
| dc.identifier.scopusid | 2-s2.0-51249090154 | - |
| dc.identifier.wosid | 000256956600495 | - |
| dc.identifier.bibliographicCitation | Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest, pp.979 - 980 | - |
| dc.relation.isPartOf | Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest | - |
| dc.citation.title | Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest | - |
| dc.citation.startPage | 979 | - |
| dc.citation.endPage | 980 | - |
| dc.type.rims | ART | - |
| dc.type.docType | Conference Paper | - |
| dc.description.journalClass | 1 | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalResearchArea | Optics | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.relation.journalWebOfScienceCategory | Optics | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordPlus | Carrier lifetime | - |
| dc.subject.keywordPlus | Civil aviation | - |
| dc.subject.keywordPlus | Electromagnetic waves | - |
| dc.subject.keywordPlus | Gallium alloys | - |
| dc.subject.keywordPlus | Gallium nitride | - |
| dc.subject.keywordPlus | Light emission | - |
| dc.subject.keywordPlus | Light emitting diodes | - |
| dc.subject.keywordPlus | Light sources | - |
| dc.subject.keywordPlus | Plastics molding machines | - |
| dc.subject.keywordPlus | Semiconducting gallium | - |
| dc.subject.keywordPlus | Device parameters | - |
| dc.subject.keywordPlus | Electro-optics | - |
| dc.subject.keywordPlus | Pacific Rim | - |
| dc.subject.keywordPlus | Light | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/4391579 | - |
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Related Researcher
- Shim, Jong In
- COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY (DEPARTMENT OF PHOTONICS AND NANOELECTRONICS)